Manuscript published

Our manuscript entitled “Measuring material parameters using a tunable monochromatic terahertz wave source” was published in Applied Optics.

It is a result of series of collaborative works with RICOH Company. We suggested one of promising technique to determine optical constants in THz-wave region using the monochromatic tunable THz source (reported in 2017) combination with high sensitivity FMB diode as a detector.

The technique applied for precise measurement of parameters can also be used to predict the behavior of multilayerd boundaries of known materials. We suggested polyethylene thin film is applicable as simple method to reduce the surface reflection on silicon.

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